The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2018

Filed:

Jul. 10, 2015
Applicant:

Carl Zeiss Smt Gmbh, Oberkochen, DE;

Inventors:

Thomas Schicketanz, Aalen, DE;

Hans-Jochen Paul, Aalen, DE;

Christoph Zaczek, Heubach, DE;

Assignee:

Carl Zeiss SMT GmbH, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/70 (2006.01); G03B 27/54 (2006.01); G03F 7/20 (2006.01); G21K 1/06 (2006.01); B82Y 10/00 (2011.01); G02B 5/08 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70316 (2013.01); B82Y 10/00 (2013.01); G02B 5/0816 (2013.01); G02B 5/0891 (2013.01); G03F 7/702 (2013.01); G03F 7/70958 (2013.01); G21K 1/062 (2013.01); G21K 2201/067 (2013.01);
Abstract

An EUV mirror with a substrate and a multilayer arrangement including: a periodic first layer group having N>1 first layer pairs of period thickness Pand arranged on a radiation entrance side of the multilayer arrangement; a periodic second layer group having N>1 second layer pairs of period thickness Pand arranged between the first layer group and the substrate; and a third layer group having Nthird layer pairs arranged between the first and second layer groups. N>N. The third layer group has a third period thickness Pwhich deviates from an average period thickness P=(P+P)/2 by a period thickness difference ΔP. ΔP corresponds to the quotient of the optical layer thickness (λ/4) of a quarter-wave layer and the product of Nand cos(AOI), AOIbeing the mean incidence angle for which the multilayer arrangement is designed.


Find Patent Forward Citations

Loading…