The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2018

Filed:

Oct. 05, 2015
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Hsiu-Ming Yeh, Hsinchu, TW;

Feng-Inn Wu, Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 53/017 (2012.01); B24B 53/053 (2006.01); B24B 53/00 (2006.01); B24B 53/02 (2012.01); B24B 53/12 (2006.01); H01L 21/306 (2006.01);
U.S. Cl.
CPC ...
B24B 53/017 (2013.01); B24B 53/003 (2013.01); B24B 53/02 (2013.01); B24B 53/053 (2013.01); B24B 53/12 (2013.01); H01L 21/30625 (2013.01);
Abstract

A method of using a chemical mechanical polishing (CMP)apparatus that includes a apparatus is provided. The method includes providing a conditioning disc for conditioning the polishing pad, where the conditioning disc includes a plurality of portions of subsystem discs. The portions may be regions of the disc that are concentric. Each portion of the disc is operable to rotate at a different angular velocity. In some embodiments, a different applied loading is provided to each of the portions of the disc in addition to or in lieu of the different angular velocities.


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