The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Apr. 08, 2015
Applicants:

Byung-gil Jeon, Suwon-si, KR;

Doo-gon Kim, Hwaseong-si, KR;

Inventors:

Byung-Gil Jeon, Suwon-si, KR;

Doo-Gon Kim, Hwaseong-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G11C 29/02 (2006.01); G11C 29/50 (2006.01); G11C 11/16 (2006.01); G11C 13/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/025 (2013.01); G11C 29/023 (2013.01); G11C 29/025 (2013.01); G11C 29/026 (2013.01); G11C 29/50008 (2013.01); G11C 11/1673 (2013.01); G11C 13/00 (2013.01); G11C 2029/5006 (2013.01);
Abstract

A leakage current detection device includes a test detection circuit, a reference detection circuit, a comparator, and a latch circuit. The test detection circuit is coupled between a test node and a test line, provides a voltage to the test node to charge the test line, floats the test node and the test line, and decreases a voltage of the test node based on leakage current of the test line. The reference detection circuit is coupled between a reference node and a reference line, provides the voltage to the reference node to charge the reference line, floats the reference node and the reference line, and decreases a voltage of the reference node based on self-discharge of the reference line. The comparator outputs a comparison signal by comparing voltages of the test node and the reference node. The latch circuit latches the comparison signal to output a test result signal.


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