The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2018

Filed:

Mar. 23, 2017
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Stefan Flachowsky, Dresden, DE;

Ralf Illgen, Dresden, DE;

Assignee:

GLOBALFOUNDRIES Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/12 (2006.01); H01L 21/265 (2006.01); H01L 21/308 (2006.01); H01L 21/3105 (2006.01); H01L 21/3213 (2006.01); H01L 21/324 (2006.01); H01L 21/84 (2006.01); H01L 29/06 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1207 (2013.01); H01L 21/26513 (2013.01); H01L 21/308 (2013.01); H01L 21/31051 (2013.01); H01L 21/324 (2013.01); H01L 21/32139 (2013.01); H01L 21/84 (2013.01); H01L 29/0649 (2013.01); H01L 29/66545 (2013.01); H01L 29/66689 (2013.01); H01L 29/7816 (2013.01);
Abstract

A semiconductor structure includes a semiconductor substrate, a layer of electrically insulating material above the semiconductor substrate, and a layer of semiconductor material above the layer of electrically insulating material. A first transistor includes a first source region, a first drain region, and a first channel region formed in the semiconductor substrate, a first gate insulation layer positioned above the first channel region, and an electrically conductive first gate electrode, wherein the first gate insulation layer includes a first portion of the electrically insulating material. A second transistor includes a second source region, a second drain region, and a second channel region formed in the layer of semiconductor material, a second gate insulation layer positioned above the second channel region, and an electrically conductive second gate electrode, wherein a second portion of the layer of electrically insulating material is positioned below the second channel region.


Find Patent Forward Citations

Loading…