The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2018

Filed:

Jun. 16, 2016
Applicant:

Sandisk Technologies Inc., Plano, TX (US);

Inventors:

Yen-Lung Li, San Jose, CA (US);

Jong Yuh, Pleasanton, CA (US);

Jonathan Huynh, San Jose, CA (US);

Tai-Yuan Tseng, Milpitas, CA (US);

Kwang-Ho Kim, Pleasanton, CA (US);

Qui Nguyen, San Jose, CA (US);

Assignee:

SANDISK TECHNOLOGIES LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 16/08 (2006.01); G11C 16/26 (2006.01); G11C 16/34 (2006.01); G11C 7/04 (2006.01); G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
G11C 16/08 (2013.01); G11C 7/04 (2013.01); G11C 16/26 (2013.01); G11C 16/3459 (2013.01); G11C 16/0483 (2013.01);
Abstract

Systems and methods for reducing sensing time for sensing data states stored within a plurality of memory cells are described. In some cases, the ramping of a word line connected to the plurality of memory cells may be delayed until a threshold current corresponding with a particular number of erased memory cells of the plurality of memory cells has been met or exceeded. The threshold current may be compared with a summation of a first set of detection currents corresponding with a first set of memory cells of the plurality of memory cells that have been sensed to be in a conducting state while the word line is set to a voltage level for sensing erased memory cells. The threshold current may be set based on a chip temperature and/or a particular number of bit errors that occurred during a prior sensing operation.


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