The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Nov. 24, 2014
Applicant:

Varian Semiconductor Equipment Associates, Inc., Gloucester, MA (US);

Inventors:

Kevin M. Daniels, Lynnfield, MA (US);

Russell J. Low, Bellemead, NH (US);

Nicholas P. T. Bateman, Reading, MA (US);

Benjamin B. Riordon, Newburyport, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/08 (2006.01); C23C 14/04 (2006.01); H01J 37/317 (2006.01); H01L 21/266 (2006.01); C23C 14/48 (2006.01);
U.S. Cl.
CPC ...
C23C 14/042 (2013.01); C23C 14/48 (2013.01); H01J 37/3171 (2013.01); H01L 21/266 (2013.01); H01J 2237/08 (2013.01); H01J 2237/303 (2013.01); H01J 2237/31711 (2013.01);
Abstract

Herein, an improved technique for processing a substrate is disclosed. In one particular exemplary embodiment, the technique may be achieved using a mask for processing the substrate. The mask may be incorporated into a substrate processing system such as, for example, an ion implantation system. The mask may comprise one or more first apertures disposed in a first row; and one or more second apertures disposed in a second row, each row extending along a width direction of the mask, wherein the one or more first apertures and the one or more second apertures are non-uniform.


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