The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9857698 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 02, 2018

Filed:

Mar. 19, 2015
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Assignee:

ASML NETHERLANDS B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/54 (2006.01); G03F 7/20 (2006.01); G02B 7/182 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70775 (2013.01); G02B 7/1828 (2013.01); G03F 7/70258 (2013.01); G03F 7/70758 (2013.01); G03F 7/70825 (2013.01);
Abstract

A lithographic apparatus includes a reflector to redirect a radiation beam, e.g. an EUV beam. The position of the reflector is controlled using a controller and a positioning system. The positioning system includes a non-compensating actuator device and a compensating actuator device to compensate for parasitic forces of the non-compensating actuator device. The positioning system and controller can provide a more accurate position of the reflector, reduce deformation of the reflector and reduce the magnitude of forces transmitting through the reflector.


Find Patent Forward Citations

De Jongh, Robertus Johannes Marinus. (2018). Lithographic apparatus and device manufacturing method (U.S. Patent No. 9857698). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9857698

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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