The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2017
Filed:
Apr. 15, 2015
Teachers Insurance and Annuity Association of America, New York, NY (US);
Gary Robert Couture, Hollis, NH (US);
Mathew Wade Pickering, Port Orange, FL (US);
Ethan Luke Michaud, Harrisburg, NC (US);
Latrisha Devon Whitehead, Charlotte, NC (US);
Andrew Eugene Kettering, Westford, MA (US);
Scott Matthew Blandford, Hopewell, NJ (US);
Rafael Pedro Olaso, Mendon, MA (US);
LeeAnn Marie Flanagan, Medway, MA (US);
Elizabeth Anne MacDonald, Schenectady, NY (US);
William V. Arneth, III, Westborough, MA (US);
Ryan Matthew Wiesman, Wausau, WI (US);
Scott James Danesi, Concord, NC (US);
Thomas Steven Joyce, Washington, DC (US);
Jennifer D'awn Jeffress, Bailey, CO (US);
Eddie Gordon Finch, Jr., Cornelius, NC (US);
Matthew M. Bechard, Forestdale, MA (US);
Nathaniel J. Bates, Portsmouth, NH (US);
Edmund Martin Prout, Merrimack, NH (US);
Devesh Patel, Waxhaw, NC (US);
Jakkinpali Murty, Harrisburg, NC (US);
Kristopher C. Krug, Matthews, NC (US);
Daniel Joseph Healy, Jr., Dudley, MA (US);
Omar C. Saxton, Charlotte, NC (US);
Kevin M. McGill, Mansfield, MA (US);
Teachers Insurance and Annuity Association of America, New York, NY (US);
Abstract
Systems and methods for presenting application performance monitoring data in distributed computer systems. An example method may comprise: receiving, by a processing device, one or more application performance monitoring (APM) rules, each APM rule determining an application operational status based on one or more APM parameters; receiving APM data comprising a plurality of APM data items representing values of the APM parameters of a software application; determining an operational status of the software application by applying the APM rules to the APM data; and causing the operational status to be visually represented via a graphical user interface (GUI).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile