The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2017

Filed:

Dec. 24, 2014
Applicant:

Industrial Technology Research Institute, Chutung, Hsinchu County, TW;

Inventors:

Wen-Li Wu, Chutung, TW;

Yen-Song Chen, Chutung, TW;

Wei-En Fu, Chutung, TW;

Yun-San Chien, Chutung, TW;

Hsin-Chia Ho, Chutung, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/201 (2006.01); H01L 21/68 (2006.01);
U.S. Cl.
CPC ...
H01L 21/68 (2013.01); G01N 2223/054 (2013.01); G01N 2223/6116 (2013.01);
Abstract

The disclosure provides an apparatus for aligning first and second plates that are parallel to each other and have the same orientation. The apparatus includes a detector that detects composite small-angle X-ray scattering emitted from patterns of the first and second plates that are perpendicularly impinged by X-ray, and a moving unit that aligns the first and second plates according to a composite amplitude distribution of the composite small-angle X-ray scattering. Therefore, the first and second plates are aligned to each other accurately.


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