The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

Jan. 08, 2013
Applicant:

Freescale Semiconductor, Inc., Austin, TX (US);

Inventors:

Robert Krutsch, Munich, DE;

Laurent Emmerich, Munich, DE;

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/20 (2011.01); G06F 3/14 (2006.01); G06F 3/147 (2006.01); B60K 37/02 (2006.01); G06T 15/00 (2011.01);
U.S. Cl.
CPC ...
G06F 3/1431 (2013.01); B60K 37/02 (2013.01); G06F 3/147 (2013.01); G06T 15/005 (2013.01); G06T 15/20 (2013.01); G06T 2215/16 (2013.01);
Abstract

A method of estimating a fragment count for the display of at least one three-dimensional (3D) object. The method comprises determining an ellipsoid representative of a set of vertices defined by coordinates of the at least one 3D object, applying a transformation to the ellipsoid, calculating a projection area of the transformed ellipsoid, and estimating the fragment count for the display of the 3D object based at least partly on the calculated projection area of the transformed ellipsoid.


Find Patent Forward Citations

Krutsch, Robert. (2017). Method and apparatus for estimating a fragment count for the display of at least one three-dimensional object (U.S. Patent No. 9823889). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9823889

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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