The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Jun. 23, 2015
Applicant:
Synopsys, Inc., Mountain View, CA (US);
Inventors:
Jamil Kawa, Campbell, CA (US);
Thu Nguyen, Palo Alto, CA (US);
Tzong-Kwang Henry Yeh, Los Gatos, CA (US);
Shih-Yao Christine Sun, San Jose, CA (US);
Raymond Tak-Hoi Leung, Palo Alto, CA (US);
Assignee:
SYNOPSYS, INC., Mountain View, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2014.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2628 (2013.01); G06F 17/5081 (2013.01);
Abstract
A circuit is powered through a transistor whose thermal instability behavior is to be evaluated in a stress test. The transistor is stressed during a stress phase of the stress test with a sensor circuit powered off and the Vds of the transistor is zero. The sensor circuit is powered on through the transistor during an evaluate phase of the stress test.