The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2017
Filed:
Jun. 26, 2015
Qingdao Goertek Technology Co.,ltd., Qingdao, CN;
Qingdao GoerTek Technology Co., Ltd., Qingdao, CN;
Abstract
A method for measuring lens distortion, comprising: providing a test card having a dot matrix pattern of K×N dots, wherein the K and the N are both natural numbers (); obtaining a distorted image of the test card after being distorted by a lens (); establishing a planar coordinate system for the distorted image by using a dot at an upper left corner of the distorted image as a coordinate origin, a rightward direction from the origin as a positive direction of axis X, and a downward direction from the origin as a positive direction of axis Y (); positioning a center dot of the distorted image and all non-center dots by scanning and searching, and determining coordinate values of the center dot and all the non-center dots in the planar coordinate system (); and calculating a distortion amount of the distorted image by using the coordinate values of the center dot and all the non-center dots according to a distortion amount calculation equation for the distorted image, thereby obtaining a distortion amount of the lens (). Also disclosed is a system for measuring lens distortion. The measurement method and system accelerates the image processing speed and improves the lens distortion measurement accuracy.