The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2017

Filed:

Sep. 14, 2015
Applicants:

Qualcomm Incorporated, San Diego, CA (US);

Industry-academic Cooperation Foundation, Yonsei University, Seoul, KR;

Inventors:

Seong-Ook Jung, Seoul, KR;

Sara Choi, Seoul, KR;

Byung Kyu Song, Seoul, KR;

Taehui Na, Seoul, KR;

Jisu Kim, Seoul, KR;

Jung Pill Kim, San Diego, CA (US);

Sungryul Kim, San Diego, CA (US);

Taehyun Kim, Cupertino, CA (US);

Seung Hyuk Kang, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); G06F 11/10 (2006.01); H03M 13/15 (2006.01);
U.S. Cl.
CPC ...
H03M 13/616 (2013.01); G06F 11/10 (2013.01); H03M 13/152 (2013.01); H03M 13/1575 (2013.01); H03M 13/617 (2013.01); H03M 13/6502 (2013.01);
Abstract

Error detection and correction decoding apparatus performs single error correction-double error detection (SEC-DED) or double error correction-triple error detection (DEC-TED) depending on whether the data input contains a single-bit error or a multiple-bit error, to reduce power consumption and latency in case of single-bit errors and to provide powerful error correction in case of multiple-bit errors.


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