The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Jun. 22, 2011
Applicants:

Takayuki Yamagishi, Kashiwazaki, JP;

Masaei Suwada, Nagaoka, JP;

Hiroyuki Tanaka, Nagaoka, JP;

Inventors:

Takayuki Yamagishi, Kashiwazaki, JP;

Masaei Suwada, Nagaoka, JP;

Hiroyuki Tanaka, Nagaoka, JP;

Assignee:

ASM Japan K.K., Tama-shi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/68 (2006.01); H01L 21/687 (2006.01);
U.S. Cl.
CPC ...
H01L 21/681 (2013.01); H01L 21/68742 (2013.01);
Abstract

A method for positioning wafers in dual wafer transport, includes: simultaneously moving first and second wafers placed on first and second end-effectors to positions over lift pins protruding from first and second susceptors, respectively; and correcting the positions of the first and second wafers without moving any of the lift pins relative to the respective susceptors or without moving the lift pins relative to each other, wherein when the first and second wafers are moved to the respective positions, the distance between the first wafer and tips of the lift pins of the first susceptor is substantially smaller than the distance between the second wafer and tips of the lift pins of the second susceptor.

Published as:
US2012325148A1; KR20130000333A; US9793148B2;

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