The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Aug. 31, 2015
Intel Corporation, Santa Clara, CA (US);
Kalpana Seshadrinathan, Santa Clara, CA (US);
Oscar Nestares, San Jose, CA (US);
Ali Mehdizadeh, Belmont, CA (US);
Max T. Stein, Santa Clara, CA (US);
Yi Wu, San Jose, CA (US);
James Granger, Larkspur, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Systems and methods for determining point-to-point distances from 3D image data. In some embodiments, two measure points, for example specified by a user, represent endpoints on an object of interest within an image frame. Assuming all points lying between these endpoints also belong to the object of interest, additional 3D data associated with points that lie along a measurement line defined by the measure points may be leveraged to provide a robust distance measurement. In some embodiments, total least squares fitting is performed, for example through Robust Principal Component Analysis (RPCA) to identify linear structures within the set of the 3D coordinates on the measurement line. In some exemplary embodiments, the minimum covariance determinant (MCD) estimator of the covariance matrix of the data is computed for a highly robust estimate of multivariate location and multivariate scatter.