The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2017

Filed:

Nov. 14, 2013
Applicant:

Canon Anelva Corporation, Kawasaki-shi, Kanagawa, JP;

Inventors:

Yoshimitsu Kodaira, Kawasaki, JP;

Isao Takeuchi, Kawasaki, JP;

Mihoko Nakamura, Kawasaki, JP;

Assignee:

CANON ANELVA CORPORATION, Kawasaki-Shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/3065 (2006.01); H01L 43/12 (2006.01); H01J 37/305 (2006.01);
U.S. Cl.
CPC ...
H01L 43/12 (2013.01); H01J 37/3056 (2013.01); H01L 21/3065 (2013.01); H01J 2237/20214 (2013.01); H01J 2237/304 (2013.01);
Abstract

A production process in which in an element isolation process for a magnetoresistive effect element, a re-deposited film adhered to a side wall of the element is efficiently removed by ion beam etching. Ion beam etching is performed while a substrate located being inclined relative to the grid is rotated. In the ion beam etching, an energy amount of an ion beam entering from a direction in which a pattern groove formed on the substrate extends is increased larger than the energy amount of the ion beam entering from another direction by controlling a rotation speed of the substrate, and the re-deposited film adhered to the side wall of the magnetoresistive effect element formed on the substrate is efficiently removed by etching.


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