The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Dec. 01, 2015
Applicant:

Hitachi Kokusai Electric Inc., Tokyo, JP;

Inventors:

Tatsushi Ueda, Toyama, JP;

Tadashi Terasaki, Imizu, JP;

Unryu Ogawa, Toyama, JP;

Akito Hirano, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/31 (2006.01); H01L 21/02 (2006.01); H01L 21/28 (2006.01); C23C 16/50 (2006.01); C23F 1/00 (2006.01); C23F 1/08 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02236 (2013.01); C23C 16/50 (2013.01); C23F 1/00 (2013.01); C23F 1/08 (2013.01); H01L 21/0223 (2013.01); H01L 21/02233 (2013.01); H01L 21/02238 (2013.01); H01L 21/02252 (2013.01); H01L 21/28247 (2013.01); H01L 21/28273 (2013.01);
Abstract

A manufacturing method of a semiconductor device includes generating hydrogen radicals by plasma excitation of hydrogen gas and exposing a surface of a substrate on which silicon and metal are exposed to a reducing atmosphere created with the hydrogen radicals, and generating hydrogen radicals and hydroxyl radicals by plasma excitation of a mixed gas of hydrogen gas and oxygen-containing gas and oxidizing the silicon exposed on the surface of the substrate by exposing the surface of the substrate to the hydrogen radicals and hydroxyl radicals to obtain the substrate on which the metal and oxidized silicon are formed.


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