The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Mar. 19, 2012
Applicants:

Rikimaru Sakamoto, Toyama, JP;

Yasushi Sakaida, Toyama, JP;

Bangching Ho, Toyama, JP;

Inventors:

Rikimaru Sakamoto, Toyama, JP;

Yasushi Sakaida, Toyama, JP;

Bangching Ho, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03C 5/29 (2006.01); G03F 7/32 (2006.01); H01L 21/027 (2006.01); H01L 21/306 (2006.01); H01L 21/033 (2006.01); G03F 7/09 (2006.01); G03F 7/11 (2006.01); G03F 7/26 (2006.01);
U.S. Cl.
CPC ...
G03F 7/325 (2013.01); G03F 7/094 (2013.01); G03F 7/11 (2013.01); G03F 7/26 (2013.01); H01L 21/027 (2013.01); H01L 21/0275 (2013.01); H01L 21/0337 (2013.01); H01L 21/306 (2013.01);
Abstract

Disclosed is a developer, one that does not cause pattern collapse during the formation process, for the formation of a fine pattern and a method for pattern formation using the developer. A developer used in a lithography process includes a polymer for forming a dry-etching mask and an organic solvent. The polymer is preferably a curable resin different from a curable resin forming a resist film. The developer is preferably used after exposure of the resist film. The organic solvent in the developer is preferably butyl acetate or a mixed solvent of butyl acetate and an alcohol, or 2-pentanone or a mixed solvent of 2-pentanone and an alcohol. Also disclosed is a method for producing a semiconductor device.


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