The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Oct. 29, 2015
Applicant:

Freescale Semiconductor, Inc., Austin, TX (US);

Inventor:

Robert J. Wenzel, Austin, TX (US);

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K 1/09 (2006.01); H05K 1/11 (2006.01); H01L 23/498 (2006.01); H01L 21/48 (2006.01);
U.S. Cl.
CPC ...
H01L 23/49844 (2013.01); H01L 21/4853 (2013.01);
Abstract

A substrate having an edge; a first and second active trace, wherein the first active trace corresponds to a first signal of a differential pair and the second active trace corresponds to a second signal of the differential pair; and a first and second conductive via which are located at different distances from the edge. The first active trace is routed to the first conductive via, and the second active trace is routed around the first conductive via to the second conductive via such that the second active trace is between the first conductive via and the edge. The substrate includes a first plating trace in electrical contact with the first active trace, and a second plating trace in electrical contact with the second active trace, wherein the first and second plating traces are routed to the edge on different metal layers of the substrate.


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