The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Apr. 13, 2016
Applicant:
Lam Research Corporation, Fremont, CA (US);
Inventors:
Arthur M. Howald, Livermore, CA (US);
John C. Valcore, Jr., Fremont, CA (US);
Andrew Fong, Pleasanton, CA (US);
David Hopkins, Newark, CA (US);
Assignee:
Lam Research Corporation, Fremont, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/00 (2006.01); H01J 37/32 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32183 (2013.01); G06F 17/5036 (2013.01);
Abstract
Systems and methods for tuning an impedance matching network in a step-wise fashion for each state are described. By tuning the impedance matching network in a step-wise fashion for each state instead of directly achieving optimum values of a radio frequency (RF) for each state and directly achieving an optimal value of a combined variable capacitance for each state, processing of a wafer using the tuned optimal values becomes feasible.