The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Oct. 15, 2014
Applicants:
Mark D. Hall, Austin, TX (US);
Mehul D. Shroff, Austin, TX (US);
Inventors:
Mark D. Hall, Austin, TX (US);
Steven G. H. Anderson, Austin, TX (US);
Mehul D. Shroff, Austin, TX (US);
Assignee:
NXP USA, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); H01L 27/06 (2006.01); G01R 31/3181 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2632 (2013.01); G01R 31/2644 (2013.01); H01L 27/0629 (2013.01); G01R 31/31816 (2013.01);
Abstract
A semiconductor device includes a substrate, first electronic circuitry formed on the substrate, a first diode buried in the substrate under the first electronic circuitry, and a first fault detection circuit coupled to the first diode to detect energetic particle strikes on the first electronic circuitry.
Hall, Mark. (2017). Semiconductor device with upset event detection and method of making (U.S. Patent No. 9702925). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9702925
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile