The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2017

Filed:

Aug. 31, 2016
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Andreas Haertl, Munich, DE;

Frank Hille, Munich, DE;

Francisco Javier Santos Rodriguez, Villach, AT;

Daniel Schloegl, Villach, AT;

Andre Rainer Stegner, Munich, DE;

Christoph Weiss, Munich, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/00 (2006.01); H01L 21/22 (2006.01); H01L 21/38 (2006.01); H01L 29/06 (2006.01); H01L 29/78 (2006.01); H01L 29/739 (2006.01); H01L 29/66 (2006.01); H01L 29/10 (2006.01); H01L 29/32 (2006.01); H01L 21/285 (2006.01); H01L 29/167 (2006.01); H01L 29/861 (2006.01); H01L 21/265 (2006.01);
U.S. Cl.
CPC ...
H01L 29/063 (2013.01); H01L 21/28568 (2013.01); H01L 29/0607 (2013.01); H01L 29/1095 (2013.01); H01L 29/167 (2013.01); H01L 29/32 (2013.01); H01L 29/66136 (2013.01); H01L 29/66325 (2013.01); H01L 29/66674 (2013.01); H01L 29/7393 (2013.01); H01L 29/7801 (2013.01); H01L 29/861 (2013.01); H01L 21/26506 (2013.01);
Abstract

A semiconductor device includes a first semiconductor region having first charge carriers of a first conductivity type and a second semiconductor region having second charge carriers. The first semiconductor region includes a transition region in contact with the second semiconductor region, the transition region having a first concentration of the first charge carriers, a contact region having a second concentration of the first charge carriers, wherein the second concentration is higher than the first concentration, and a damage region between the contact region and the transition region. The damage region is configured for reducing lifetime and/or mobility of the first charge carriers of the damage region as compared to the lifetime and/or the mobility of the first charge carriers of the contact region and the transition region.


Find Patent Forward Citations

Loading…