The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Sep. 09, 2015
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu County, TW;

Inventors:

Feng Wei Kuo, Zhudong Township, TW;

Kuang-Kai Yen, Kaohsiung, TW;

Jinn-Yeh Chien, Chu Bei, TW;

Chewn-Pu Jou, Hsinchu, TW;

Robert Bogdan Staszewski, Delft, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/099 (2006.01);
U.S. Cl.
CPC ...
H03L 7/0991 (2013.01);
Abstract

A calibration procedure that uses direct measurement of digital phase error performance for low cost calibration of all-digital phase locked loop (ADPLL)/digitally-controlled oscillator (DCO) is described. Direct measurement of digital phase error, or difference in digital phase error, is used to adjust the operating point of the DCO and thereby determine the operating point that provides the optimal phase noise of the output signal. Calibration may be performed at any time so that changes in external factors such as process, voltage and temperature (PVT) may be incorporated into the setting of the operating point of the DCO.


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