The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Nov. 18, 2013
Applicant:

Senju Metal Industry Co., Ltd., Tokyo, JP;

Inventors:

Koji Watanabe, Tochigi-ken, JP;

Minoru Toyoda, Tochigi-ken, JP;

Satoshi Tomita, Tochigi-ken, JP;

Tsutomu Sugino, Tochigi-ken, JP;

Daichi Kikuchi, Tochigi-ken, JP;

Hiroki Oshima, Tochigi-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 35/00 (2006.01); B23K 35/14 (2006.01); B23K 35/02 (2006.01); B23K 35/28 (2006.01); B23K 1/00 (2006.01); B23K 1/19 (2006.01); C22C 12/00 (2006.01); B32B 15/01 (2006.01); B23K 35/26 (2006.01); B23K 35/40 (2006.01); C22C 1/00 (2006.01); C22C 11/06 (2006.01); C22C 13/00 (2006.01); C22C 13/02 (2006.01); C22C 21/14 (2006.01); H05K 3/34 (2006.01); B23K 101/42 (2006.01);
U.S. Cl.
CPC ...
B23K 35/0238 (2013.01); B23K 1/0016 (2013.01); B23K 1/19 (2013.01); B23K 35/0222 (2013.01); B23K 35/0233 (2013.01); B23K 35/26 (2013.01); B23K 35/262 (2013.01); B23K 35/268 (2013.01); B23K 35/28 (2013.01); B23K 35/40 (2013.01); B32B 15/01 (2013.01); B32B 15/018 (2013.01); C22C 1/00 (2013.01); C22C 11/06 (2013.01); C22C 12/00 (2013.01); C22C 13/00 (2013.01); C22C 13/02 (2013.01); C22C 21/14 (2013.01); H05K 3/3463 (2013.01); B23K 2201/42 (2013.01); H05K 2201/10992 (2013.01); H05K 2203/0405 (2013.01); H05K 2203/12 (2013.01); Y10T 428/12986 (2015.01);
Abstract

When soldering a package having an electrode on which Ni/Au or Ag—Pd alloy is plated, to a printed circuit board having a Cu electrode or an electrode on which Cu is plated, a solid-phase diffusion layer is formed within a layered solder material for bonding different species of electrodes. The layered solder material is composed of a solder material of Sn—Ag—Cu series or Sn—Sb series and a solder material of Sn—Ag—Cu—Ni series or Sn—Pb series. The electrode on which Ni/Au or Ag—Pd alloy is plated and the Cu electrode or the electrode on which Cu is plated are soldered with the solder material of Sn—Ag—Cu series or Sn—Sb series being attached to the Cu electrode and the solder material of Sn—Ag—Cu—Ni series or Sn—Cu series being attached to the electrode on which Ni/Au or Ag—Pd alloy is plated. This restrains formation of intermetallic compounds and provides high bonding reliability.


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