The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Mar. 08, 2016
Applicant:

Globalfoundries Singapore Pte. Ltd., Singapore, SG;

Inventors:

Xuan Anh Tran, Singapore, SG;

Eng Huat Toh, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/11 (2006.01); H01L 21/82 (2006.01); H01L 29/423 (2006.01); H01L 27/112 (2006.01); H01L 29/06 (2006.01); H01L 29/08 (2006.01); H01L 23/528 (2006.01); H01L 21/762 (2006.01); H01L 21/8234 (2006.01); H01L 27/088 (2006.01); H01L 27/1157 (2017.01); H01L 29/78 (2006.01); H01L 27/11524 (2017.01); H01L 27/11517 (2017.01); H01L 27/115 (2017.01);
U.S. Cl.
CPC ...
H01L 27/11206 (2013.01); H01L 21/76224 (2013.01); H01L 21/823431 (2013.01); H01L 21/823481 (2013.01); H01L 23/528 (2013.01); H01L 27/0886 (2013.01); H01L 27/115 (2013.01); H01L 27/1157 (2013.01); H01L 27/11517 (2013.01); H01L 27/11524 (2013.01); H01L 29/0649 (2013.01); H01L 29/0847 (2013.01); H01L 29/42328 (2013.01); H01L 29/42344 (2013.01); H01L 29/7841 (2013.01);
Abstract

Integrated circuits and methods of forming the same are provided. An exemplary integrated circuit includes a semiconductor substrate having a central shallow trench isolation (STI) region. A pair of select transistors have drain regions in contact with opposite portions of the central STI region. A central gate structure overlies the central STI region and includes a central gate dielectric layer. The central gate dielectric layer has a medial dielectric region overlying the central STI region, a first lateral dielectric region overlying the first drain region, and a second lateral dielectric region overlying the second drain region. The first lateral dielectric region defines a first programmable element and the second lateral dielectric region defines a second programmable element.


Find Patent Forward Citations

Tran, Xuan. (2017). Programmable integrated circuits and methods of forming the same (U.S. Patent No. 9659943). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9659943

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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