The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Oct. 30, 2013
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Chi-Cheng Tsai, New Taipei, TW;

Hung-Chi Wu, Hsinchu, TW;

Tsung-Chuan Lee, Taipei, TW;

Chung-Hsien Lin, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/38 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
G03F 7/38 (2013.01); G03F 7/2024 (2013.01); G03F 7/70341 (2013.01);
Abstract

Embodiments of performing a photolithography process are provided. The method for performing the photolithography process includes providing a substrate and forming a photoresist layer over the substrate. The method further includes forming exposed photoresist portions by performing an exposure process on the photoresist layer. The method further includes performing a surface modifying treatment on the photoresist layer after the exposure process and removing the exposed photoresist portions by performing a developing process.


Find Patent Forward Citations

Tsai, Chi-Cheng. (2017). Mechanisms for performing a photolithography process with a surface modifying treatment on an exposed photoresist layer (U.S. Patent No. 9625822). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9625822

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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