The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2017

Filed:

Aug. 20, 2014
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Wei-Shuo Ho, New Taipei, TW;

Tsung-Yu Chiang, New Taipei, TW;

Kuang-Hsin Chen, Jung-Li, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/088 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/06 (2006.01); H01L 21/306 (2006.01); H01L 21/02 (2006.01); H01L 21/283 (2006.01); H01L 21/324 (2006.01); H01L 21/311 (2006.01); H01L 29/51 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7851 (2013.01); H01L 21/0214 (2013.01); H01L 21/02126 (2013.01); H01L 21/02164 (2013.01); H01L 21/283 (2013.01); H01L 21/30604 (2013.01); H01L 21/31144 (2013.01); H01L 21/324 (2013.01); H01L 27/0886 (2013.01); H01L 29/0649 (2013.01); H01L 29/51 (2013.01); H01L 29/518 (2013.01); H01L 29/6681 (2013.01);
Abstract

A semiconductor structure includes a substrate including a first active region, a second active region and an isolation disposed between the first active region and the second active region; a plurality of gates disposed over the substrate and including a first gate extended over the first active region, the isolation and the second active region, and a second gate over the first active region and the second active region; and an inter-level dielectric (ILD) disposed over the substrate and surrounding the plurality of gates, wherein the second gate is configured not to conduct current flow and includes a first section disposed over the first active region and a second section disposed over the second active region, a portion of the ILD is disposed between the first section and the second section.


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