The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Feb. 15, 2013
Applicant:

Mitsubishi Materials Corporation, Tokyo, JP;

Inventors:

Shoubin Zhang, Sanda, JP;

Keita Umemoto, Sanda, JP;

Masahiro Shoji, Sanda, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/35 (2006.01); B22F 3/10 (2006.01); H01J 37/34 (2006.01); C23C 14/08 (2006.01); C23C 14/34 (2006.01); C22C 1/04 (2006.01); C22C 32/00 (2006.01); C23C 14/06 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3429 (2013.01); B22F 3/10 (2013.01); C22C 1/0425 (2013.01); C22C 32/0089 (2013.01); C23C 14/0623 (2013.01); C23C 14/08 (2013.01); C23C 14/087 (2013.01); C23C 14/3414 (2013.01); C23C 14/35 (2013.01); B22F 2201/20 (2013.01); B22F 2301/00 (2013.01); B22F 2999/00 (2013.01);
Abstract

Provided is a sputtering target which contains Na in high concentration and, despite this, is inhibited from discoloration, generating spots, and causing abnormal electrical discharge and which has high strength and rarely breaks. Also provided is a method for producing the sputtering target. The sputtering target has a component composition that contains 10 to 40 at % of Ga and 1.0 to 15 at % of Na as metal element components other than F, S, and Se, with the remainder composed of Cu and unavoidable impurities, wherein the Na is contained in the form of at least one Na compound selected from sodium fluoride, sodium sulfide, and sodium selenide. The sputtering target has a theoretical density ratio of 90% or higher, a flexural strength of 100 N/mmor higher, and a bulk resistivity of 1 mΩ·cm or less. The number of 0.05 mmor larger aggregates of the at least one of sodium fluoride, sodium sulfide, and sodium selenide present per cmarea of the target surface is 1 or less on average.


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