The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Oct. 28, 2014
Applicants:

Global Unichip Corporation, Hsinchu, TW;

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Shi-Hao Chen, Nantou County, TW;

Yi-Ming Wang, New Taipei, TW;

Ting-Hao Wang, Keelung, TW;

Hung-Chun Li, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/28 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2894 (2013.01); G01R 31/31725 (2013.01);
Abstract

An aging detection circuit is provided. The aging detection circuit is configured on a chip and includes a testing circuit and an aging signal generation circuit. The testing circuit is electrically coupled to the aging signal generation circuit. The testing circuit generates an output signal. The aging signal generation circuit includes a signal generation circuit and a selection circuit. The signal generation circuit generates multiple input signals having different frequencies. The selection circuit selectively outputs one of the input signals as an aging signal to an input terminal of the testing circuit or feeds back the output signal generated by the testing circuit to the input terminal of the testing circuit.


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