The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Oct. 02, 2013
James Carriere, La Crescenta, CA (US);
Lawrence Ho, Arcadia, CA (US);
Frank Havermeyer, La Verne, CA (US);
Eric Maye, Torrance, CA (US);
Randy Heyler, Newport Beach, CA (US);
James Carriere, La Crescenta, CA (US);
Lawrence Ho, Arcadia, CA (US);
Frank Havermeyer, La Verne, CA (US);
Eric Maye, Torrance, CA (US);
Randy Heyler, Newport Beach, CA (US);
Ondax, Inc., Monrovia, CA (US);
Abstract
Provided are methods and systems for identification and analysis of materials and molecular structures. An apparatus for identification and analysis of materials and molecular structures may include a laser. The laser may, in turn, include an amplified spontaneous emission-suppressed single-frequency laser excitation source. The apparatus may further comprise a plurality of filters. The plurality of filters may include reflective volume holographic grating blocking filters. The apparatus may also comprise an optical unit and an optical spectrometer. The optical unit may be configured to deliver excitation energy to a sample substance and capture Raman signal scattering from the sample substance. The optical spectrometer may be disposed in a path of the Raman signal and configured to measure a spectrum of the Raman signal and generate a detection signal. Finally, the apparatus may comprise a processing unit configured to analyze the spectrum.