Optimization of parasitic capacitance extraction using statistical variance reduction technique

Abstract

A method for performing parasitic capacitance extraction of an integrated circuit (IC) design includes: defining a Gaussian surface around an origin net of the IC design; partitioning the Gaussian surface into a plurality of regions; performing an initial plurality of random walks from each region using a Monte Carlo field solver; and dynamically allocating an additional plurality of random walks among the plurality of regions, wherein the allocation is based on statistical errors associated with the initial plurality of random walks for each of the regions. Results from the random walks are averaged to estimate parasitic capacitance of the origin net. The method may include performing the random walks for each region in pairs, wherein a first random walk of the pair is selected in accordance with an anti-symmetric probability function, and a second random walk of the pair is antithetic to the first random walk of the pair.