The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2017

Filed:

May. 18, 2012
Applicants:

Craig W. Macnaughton, Los Gatos, CA (US);

Jaydeep K. Sinha, Livermore, CA (US);

Inventors:

Craig W. MacNaughton, Los Gatos, CA (US);

Jaydeep K. Sinha, Livermore, CA (US);

Assignee:

KLA-TENCOR CORPORATION, Milpitas, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 11/01 (2006.01); G03F 7/20 (2006.01); G05B 19/418 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70616 (2013.01); G03F 7/70525 (2013.01); G03F 7/70633 (2013.01); G05B 19/41875 (2013.01); H01L 21/67288 (2013.01);
Abstract

A method and apparatus for process control in the processing of a substrate is disclosed in the present invention. Embodiments of the present invention utilize a first analysis tool to determine changes in a substrate's geometry. The substrate geometry data is used to generate sampling plan that will be used to check areas of the substrate that are likely to have errors after processing. The sampling plan is fed forwards to a second analysis tool that samples the substrate after it has been processed. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.


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