The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Apr. 14, 2014
Applicant:

Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;

Inventors:

Yuta Imai, Tokyo, JP;

Takashi Ohshima, Tokyo, JP;

Hideo Morishita, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 29/28 (2006.01); H01J 29/00 (2006.01); H01J 27/02 (2006.01); H01J 37/073 (2006.01); H01J 27/26 (2006.01); H01J 37/063 (2006.01); H01J 37/08 (2006.01); H01J 37/28 (2006.01); H01J 37/06 (2006.01); H01J 29/48 (2006.01); H01J 37/145 (2006.01); H01J 37/20 (2006.01);
U.S. Cl.
CPC ...
H01J 37/073 (2013.01); H01J 27/02 (2013.01); H01J 27/26 (2013.01); H01J 29/481 (2013.01); H01J 37/06 (2013.01); H01J 37/063 (2013.01); H01J 37/08 (2013.01); H01J 37/145 (2013.01); H01J 37/20 (2013.01); H01J 37/28 (2013.01); H01J 2237/062 (2013.01); H01J 2237/06341 (2013.01); H01J 2237/06375 (2013.01); H01J 2237/0802 (2013.01); H01J 2237/1508 (2013.01); H01J 2237/2007 (2013.01); H01J 2237/2801 (2013.01);
Abstract

The purpose of the present invention is to provide a charged particle gun using merely an electrostatic lens, said charged particle gun being relatively small and having less aberration, and to provide a field emission-type charged particle gun having high luminance even with a high current. This charged particle gun has: a charged particle source; an acceleration electrode that accelerates charged particles emitted from the charged particle source; a control electrode, which is disposed further toward the charged particle source side than the acceleration electrode, and which has a larger aperture diameter than the aperture diameter of the acceleration electrode; and a control unit that controls, on the basis of a potential applied to the acceleration electrode, a potential to be applied to the control electrode.


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