The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Jun. 06, 2014
Applicant:

Mentor Graphics Corporation, Wilsonville, OR (US);

Inventors:

Xijiang Lin, West Linn, OR (US);

Janusz Rajski, West Linn, OR (US);

Assignee:

Mentor Graphics Corporation, Wilsonville, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3185 (2006.01); G01R 31/3183 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318575 (2013.01); G01R 31/318547 (2013.01); G01R 31/318385 (2013.01);
Abstract

The test circuitry according to various aspects of the presently disclosed techniques comprises: low-toggling pseudo-random test pattern generation circuitry, wherein the low-toggling pseudo-random test patterns generated by the low-toggling pseudo-random test pattern generation circuitry causing switching activity during scan shift cycles lower than pseudo-random test patterns generated by a pseudo-random pattern generator; scan chains configurable to shift in a low-toggling pseudo-random test pattern generated by the low-toggling pseudo-random test pattern generation circuitry; background chains configurable to shift in a background test pattern; and weight insertion circuitry configurable to modify a plurality of bits in the low-toggling pseudo-random test pattern based on bits in the background test pattern to form a weighted pseudo-random test pattern.


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