The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Dec. 01, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

John S. Bialas, Jr., South Burlington, VT (US);

David D. Cadigan, Poughkeepsie, NY (US);

Stephen P. Glancy, Poughkeepsie, NY (US);

Warren E. Maule, Cedar Park, TX (US);

Gary A. Van Huben, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/50 (2006.01); G11C 11/401 (2006.01); G11C 11/4076 (2006.01);
U.S. Cl.
CPC ...
G11C 29/50012 (2013.01); G11C 11/401 (2013.01); G11C 11/4076 (2013.01); G11C 2029/5004 (2013.01);
Abstract

A system and method for efficient data eye training reduces the time and resources spent calibrating one or more memory devices. A temporal calibration mechanism reduces the time and resources for calibration by reducing the number tests needed to sufficiently determine the boundaries of the data eye of the memory device. For one or more values of the voltage reference, the temporal calibration mechanism performs a minimal number of tests to find the edges of the data eye for the hold and setup times.


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