The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Dec. 04, 2013
Applicant:

Basf SE, Ludwigshafen, DE;

Inventors:

Andreas Klipp, Lambsheim, DE;

Andrei Honciuc, Ludwigshafen, DE;

Günter Oetter, Frankenthal, DE;

Christian Bittner, Bensheim, DE;

Assignee:

BASF SE, Ludwigshafen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/42 (2006.01); H01L 21/02 (2006.01); H01L 21/027 (2006.01); C11D 1/835 (2006.01); C11D 1/94 (2006.01); C11D 11/00 (2006.01); G03F 7/20 (2006.01); G03F 7/40 (2006.01);
U.S. Cl.
CPC ...
G03F 7/422 (2013.01); C11D 1/835 (2013.01); C11D 1/94 (2013.01); C11D 11/0047 (2013.01); G03F 7/2041 (2013.01); G03F 7/405 (2013.01); H01L 21/02057 (2013.01); H01L 21/0273 (2013.01);
Abstract

In a method of treating a substrate including patterns having line-space dimensions of 50 nm or below, the substrate is rinsed by an aqueous composition including at least one non-ionic surfactant A and at least one hydrophobizer B. The at least one surfactant A has an equilibrium surface tension of 10 mN/m to 35 mN/m, determined from a solution of the at least one surfactant A in water at the critical micelle concentration. The hydrophobizer B is selected so that the contact angle of water to the substrate is increased by contacting the substrate with a solution of the hydrophobizer B in water by 5-95° compared to the contact angle of water to the substrate before such contacting.


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