The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Mar. 14, 2016
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Charles H. Dennison, Meridian, ID (US);

Kenneth W. Marr, Boise, ID (US);

Deepak Thimmegowda, Boise, ID (US);

Philip J. Ireland, Nampa, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H01L 21/66 (2006.01); H01L 23/48 (2006.01); H01L 23/485 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2896 (2013.01); H01L 22/14 (2013.01); H01L 22/34 (2013.01); H01L 23/48 (2013.01); H01L 23/481 (2013.01); H01L 23/485 (2013.01); H01L 29/7823 (2013.01); H01L 2924/0002 (2013.01);
Abstract

Apparatuses and methods can include a die seal between an integrated circuit region of a die and a periphery of the die. A via chain(s) may be arranged around an inner circumference of the die seal between the die seal and the integrated circuit region and/or around an outer circumference of the die seal between the die seal and the periphery of the die. The via chain may include a plurality of contacts comprised of conductive material and extending through portions of the die. Circuitry may be coupled to an end of the via chain to detect an electrical signal. Additional apparatuses and methods are described.


Find Patent Forward Citations

Loading…