The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2017
Filed:
Oct. 29, 2012
E I Du Pont DE Nemours and Company, Wilmington, DE (US);
Bindu Andreuzza, Hyderabad, IN;
Milo Aukerman, Newark, DE (US);
Jason L. Brothers, Newark, DE (US);
Norbert Brugiere, Johnston, IA (US);
Mai Komatsu, Wilmington, DE (US);
Ratna Kumria, Hyderabad, IN;
Xiao-Yi Li, Wilmington, DE (US);
Cheng Lu, Newark, DE (US);
Amitabh Mohanty, Kowkur, IN;
Hajime Sakai, Newark, DE (US);
James J. Saylor, Newark, DE (US);
Sobhana Sivasankar, Adel, IA (US);
Graziana Taranino, Wilmington, DE (US);
Robert Wayne Williams, Hockessin, DE (US);
E I DU PONT DE NEMOURS AND COMPANY, Wilmington, DE (US);
PIONEER HI-BRED INTERNATIONAL, INC., Johnston, IA (US);
Abstract
Methods are described for the identification of genes useful for conferring tolerance in plants to abiotic stress. Transgenic plants and seeds comprising the stress tolerant genes are also described. Methods to monitor the growth rate of the transgenic plants under stressed or non-stressed conditions are also described.