The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Apr. 01, 2016
Applicant:

Sigray, Inc., Concord, CA (US);

Inventors:

Wenbing Yun, Walnut Creek, CA (US);

Sylvia Jia Yun Lewis, San Francisco, CA (US);

Janos Kirz, Berkeley, CA (US);

Alan Francis Lyon, Berkeley, CA (US);

Assignee:

Sigray, Inc., Concord, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 35/08 (2006.01); H01J 35/10 (2006.01); H01J 35/18 (2006.01); H01J 35/14 (2006.01); G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
H01J 35/106 (2013.01); G21K 1/06 (2013.01); H01J 35/08 (2013.01); H01J 35/14 (2013.01); H01J 35/18 (2013.01); H01J 2235/081 (2013.01); H01J 2235/086 (2013.01);
Abstract

A compact source for high brightness x-ray generation is disclosed. The higher brightness is achieved through electron beam bombardment of multiple regions aligned with each other to achieve a linear accumulation of x-rays. This may be achieved by aligning discrete x-ray sub-sources, or through the use of x-ray targets that comprise microstructures of x-ray generating materials fabricated in close thermal contact with a substrate with high thermal conductivity. This allows heat to be more efficiently drawn out of the x-ray generating material, and in turn allows bombardment of the x-ray generating material with higher electron density and/or higher energy electrons, leading to greater x-ray brightness. The orientation of the microstructures allows the use of an on-axis collection angle, allowing the accumulation of x-rays from several microstructures to be aligned to appear to have a single origin, also known as 'zero-angle' x-ray radiation.


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