The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2017
Filed:
May. 02, 2014
Applicant:
Hermes Microvision, Inc., Hsinchu, TW;
Assignee:
HERMES MICROVISION, INC., Hsinchu, TW;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/84 (2012.01); G06T 7/00 (2006.01); G01N 23/225 (2006.01); H05K 1/00 (2006.01); G03F 1/00 (2012.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G03F 1/84 (2013.01); G01N 23/2251 (2013.01); G03F 1/144 (2013.01); G06T 7/0004 (2013.01); H05K 1/00 (2013.01); G01N 21/95607 (2013.01); G06T 2207/30141 (2013.01); G06T 2207/30148 (2013.01);
Abstract
A method and system for inspecting defects saves scanned raw data as an original image so as to save time for repeated scanning and achieve faster defect inspection and lower false rate by reviewing suspicious defects and other regions of interest in the original image by using the same or different image-processing algorithm with the same or different parameters.