The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2016

Filed:

Dec. 24, 2014
Applicant:

Sumco Corporation, Tokyo, JP;

Inventors:

Masayuki Ishibashi, Tokyo, JP;

John F. Krueger, Albuquerque, NM (US);

Takayuki Dohi, Tokyo, JP;

Daizo Horie, Tokyo, JP;

Takashi Fujikawa, Tokyo, JP;

Assignee:

SUMCO Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/00 (2006.01); C30B 25/12 (2006.01); H01L 21/22 (2006.01); H01L 21/20 (2006.01); H01L 21/687 (2006.01); C23C 16/455 (2006.01); C23C 14/50 (2006.01); C23C 14/54 (2006.01); C23C 16/458 (2006.01); C30B 29/06 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
C30B 25/12 (2013.01); C23C 16/4585 (2013.01); C23C 16/45521 (2013.01); H01L 21/20 (2013.01); H01L 21/2205 (2013.01); H01L 21/68735 (2013.01); H01L 21/68785 (2013.01); C23C 14/50 (2013.01); C23C 14/54 (2013.01); C23C 16/4583 (2013.01); C23C 16/4584 (2013.01); C23C 16/45519 (2013.01); C30B 29/06 (2013.01); H01L 21/02381 (2013.01);
Abstract

A method for growing an epitaxial film on a surface of a semiconductor wafer by mounting the wafer within a susceptor pocket and supplying source gas and carrier gas to the upper surface side of the susceptor and supplying carrier gas to the lower surface side of the susceptor. The susceptor includes a substantially circular bottom wall and a sidewall encompassing the bottom wall to form a pocket for mounting the wafer, wherein a plurality of circular through-holes are formed in the bottom wall in an outer peripheral region a distance of up to about ½ the radius toward the center of the bottom wall. The total opening surface area of the through-holes is 0.05 to 55% of the surface area of the bottom wall, the opening surface area of each through-hole is 0.2 to 3.2 mmand the density of the through-holes is 0.25 to 25 per cm.


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