The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Jun. 30, 2014
Applicant:

Corning Incorporated, Corning, NY (US);

Inventors:

Paul Gerard Dewa, Newark, NY (US);

Thomas James Dunn, Penfield, NY (US);

Robert Dennis Grejda, Fairport, NY (US);

Christopher Alan Lee, Pittsford, NY (US);

Assignee:

Corning Incorporated, Corning, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/45 (2006.01); G01N 1/32 (2006.01); G01N 1/28 (2006.01); G01N 33/38 (2006.01); G02B 5/08 (2006.01); G01N 21/958 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01N 1/286 (2013.01); G01N 1/32 (2013.01); G01N 21/958 (2013.01); G01N 33/386 (2013.01); G02B 5/0816 (2013.01);
Abstract

Thickness and group index variations in test strip samples of ultra-low expansion glass are made by extracting the strip samples with front and back faces oriented at an acute skew angle to the axis of the boule. The strip samples are positioned the within an interferometric measurement cavity so that a set of subcavities formed by pairings of each of two reference surfaces together with each of the front and back faces of the strip sample which each subcavity having a different optical path length spacing. The skew angle is sized to avoid diffusion effects of striae present in the boule.


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