The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2016

Filed:

Mar. 10, 2013
Applicant:

Kla-tencor Corporation, Milpitas, CA (US);

Inventors:

Jehn-Huar Chern, Santa Clara, CA (US);

Ali R. Ehsani, San Ramon, CA (US);

Gildardo Delgado, Livermore, CA (US);

David L. Brown, Los Gatos, CA (US);

Yung-Ho Alex Chuang, Cupertino, CA (US);

John Fielden, Los Altos, CA (US);

Assignee:

KLA-Tencor Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); H01L 31/0216 (2014.01); G01N 21/95 (2006.01); G01N 21/956 (2006.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
H01L 31/0216 (2013.01); G01N 21/8806 (2013.01); G01N 21/9501 (2013.01); G01N 21/956 (2013.01); H01L 27/1462 (2013.01); H01L 27/1464 (2013.01); H01L 27/14685 (2013.01); G01N 2021/95676 (2013.01);
Abstract

An image sensor for short-wavelength light and charged particles includes a semiconductor membrane, circuit elements formed on one surface of the semiconductor membrane, and a pure boron layer on the other surface of the semiconductor membrane. This image sensor has high efficiency and good stability even under continuous use at high flux for multiple years. The image sensor may be fabricated using CCD (charge coupled device) or CMOS (complementary metal oxide semiconductor) technology. The image sensor may be a two-dimensional area sensor, or a one-dimensional array sensor. The image sensor can be included in an electron-bombarded image sensor and/or in an inspection system.


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