The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Aug. 29, 2013
Applicant:

Axcelis Technologies, Inc., Beverly, MA (US);

Inventors:

Ronald N. Reece, Westwood, MA (US);

Shu Satoh, Byfield, MA (US);

Serguei Kondratenko, Swampscott, MA (US);

Andy Ray, Newburyport, MA (US);

Assignee:

AXCELIS TECHNOLOGIES, INC., Beverly, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); C23C 14/48 (2006.01); H01J 37/304 (2006.01); H01J 37/317 (2006.01);
U.S. Cl.
CPC ...
H01L 22/26 (2013.01); C23C 14/48 (2013.01); H01J 37/304 (2013.01); H01J 37/3171 (2013.01); H01J 2237/30455 (2013.01); H01J 2237/30472 (2013.01); H01J 2237/31703 (2013.01); H01L 2924/0002 (2013.01);
Abstract

An ion implantation system is provided having an ion implantation apparatus configured to provide a spot ion beam having a beam density to a workpiece, wherein the workpiece has a crystalline structure associated therewith. A scanning system iteratively scans one or more of the spot ion beam and workpiece with respect to one another along one or more axes. A controller is also provided and configured to establish a predetermined localized temperature of the workpiece as a predetermined location on the workpiece is exposed to the spot ion beam. A predetermined localized disorder of the crystalline structure of the workpiece is thereby achieved at the predetermined location, wherein the controller is configured to control one or more of the beam density of the spot ion beam and a duty cycle associated with the scanning system to establish the localized temperature of the workpiece at the predetermined location on the workpiece.


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