The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Mar. 13, 2015
Applicant:

Lam Research Corporation, Fremont, CA (US);

Inventors:

Edward C. Opocensky, Aloha, OR (US);

Tighe A. Spurlin, Portland, OR (US);

Jonathan D. Reid, Sherwood, OR (US);

Assignee:

Lam Research Corporation, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01L 21/66 (2006.01); H01L 21/768 (2006.01); H01L 21/324 (2006.01); C23C 8/12 (2006.01); C23C 8/80 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32 (2013.01); C23C 8/12 (2013.01); C23C 8/80 (2013.01); H01J 37/32357 (2013.01); H01L 21/324 (2013.01); H01L 21/76871 (2013.01); H01L 21/76876 (2013.01); H01L 22/26 (2013.01);
Abstract

Method and apparatus for characterizing metal oxide reduction using metal oxide films formed in an anneal chamber are disclosed. Oxygen is provided into an anneal chamber. A substrate including a metal seed layer is exposed to the oxygen and exposed to a heated substrate support in the anneal chamber to form a metal oxide of the metal seed layer. The oxidized substrate can be stored for later use or transferred to a processing chamber for reducing the metal oxide to metal. The oxidized substrates formed in this manner provide metal oxides that are repeatable, uniform, and stable. The oxidized substrate is exposed to a reducing treatment under conditions that reduce the metal oxide to metal in the form of a film integrated with the metal seed layer.


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