The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2016
Filed:
Apr. 28, 2013
Applicant:
Synopsys Inc., Mountain View, CA (US);
Inventors:
John Kim, Santa Clara, CA (US);
Brian Gordon, San Jose, CA (US);
Christophe Suzor, Mimet, FR;
Karen Movsisyan, Yerevan, AM;
Assignee:
Synopsys, Inc., Mountain View, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 37/00 (2006.01); G05B 23/02 (2006.01); G05B 17/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0254 (2013.01); G05B 17/02 (2013.01); Y02P 90/14 (2015.11); Y02P 90/18 (2015.11); Y02P 90/26 (2015.11); Y02P 90/265 (2015.11);
Abstract
A method, system or computer usable program product for extracting attribute fail rates for manufactured devices including testing manufactured devices having a set of attributes to provide a set of test results stored in memory; generating a yield model of the manufactured devices parsed by the set of attributes; populating the yield model based on the set of test results; and utilizing a processor to perform statistical analysis of the populated yield model to extract fail rates of the selected subset of attributes.