The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Jan. 08, 2015
Applicant:

Renesas Electronics Corporation, Kawasaki-shi, JP;

Inventors:

Ayaka Okumura, Kawasaki, JP;

Katsuhiko Hotta, Kawasaki, JP;

Yoshinori Kondo, Kawasaki, JP;

Hiroaki Osaka, Kawasaki, JP;

Assignee:

Renesas Electronics Corporation, Kawasaki-shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); H01L 21/66 (2006.01); H01L 23/522 (2006.01); H01L 21/02 (2006.01); H01L 23/532 (2006.01); H01L 27/092 (2006.01); H01L 21/321 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 24/45 (2013.01); H01L 22/14 (2013.01); H01L 24/05 (2013.01); H01L 24/11 (2013.01); H01L 24/13 (2013.01); H01L 24/43 (2013.01); H01L 21/02178 (2013.01); H01L 21/02244 (2013.01); H01L 21/02252 (2013.01); H01L 21/321 (2013.01); H01L 21/76801 (2013.01); H01L 21/76834 (2013.01); H01L 21/76838 (2013.01); H01L 23/5226 (2013.01); H01L 23/53223 (2013.01); H01L 27/092 (2013.01); H01L 2224/13023 (2013.01); H01L 2224/13025 (2013.01); H01L 2224/43 (2013.01); H01L 2224/4502 (2013.01); H01L 2224/45144 (2013.01);
Abstract

Characteristics of a semiconductor device are improved. An opening that exposes a pad region of a top-layer wiring containing aluminum is formed in a protection film over the wiring, and aluminum nitride is formed on a surface of the exposed wiring. Additionally, a silicon nitride film is formed on a back surface of a semiconductor substrate having the wiring. As described above, foreign substances generated over the pad region due to the silicon nitride film on the back surface of the semiconductor substrate can be prevented by providing an aluminum nitride film over the pad region. Particularly, even in a case of requiring time before an inspection step and a bonding step, after a formation step of the pad region, formation reaction of the foreign substances can be prevented in the pad region, and the characteristics of the semiconductor device can be improved.


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