The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Aug. 05, 2013
Applicants:

Olga Kryliouk, Sunnyvale, CA (US);

Yuriy Melnik, Santa Clara, CA (US);

Hidehiro Kojiri, Sunnyvale, CA (US);

Tetsuya Ishikawa, Saratoga, CA (US);

Inventors:

Olga Kryliouk, Sunnyvale, CA (US);

Yuriy Melnik, Santa Clara, CA (US);

Hidehiro Kojiri, Sunnyvale, CA (US);

Tetsuya Ishikawa, Saratoga, CA (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/04 (2006.01); H01L 21/02 (2006.01); H01L 33/00 (2010.01); H01L 33/12 (2010.01); H01L 33/16 (2010.01); H01L 33/22 (2010.01);
U.S. Cl.
CPC ...
H01L 29/045 (2013.01); H01L 21/0237 (2013.01); H01L 21/0242 (2013.01); H01L 21/0243 (2013.01); H01L 21/0254 (2013.01); H01L 21/0262 (2013.01); H01L 21/02433 (2013.01); H01L 21/02439 (2013.01); H01L 21/02458 (2013.01); H01L 21/02488 (2013.01); H01L 21/02639 (2013.01); H01L 21/02647 (2013.01); H01L 29/04 (2013.01); H01L 33/007 (2013.01); H01L 33/12 (2013.01); H01L 33/16 (2013.01); H01L 33/22 (2013.01);
Abstract

A method of depositing a high quality low defect single crystalline Group III-Nitride film. A patterned substrate having a plurality of features with inclined sidewalls separated by spaces is provided. A Group III-Nitride film is deposited by a hydride vapor phase epitaxy (HVPE) process over the patterned substrate. The HVPE deposition process forms a Group III-Nitride film having a first crystal orientation in the spaces between features and a second different crystal orientation on the inclined sidewalls. The first crystal orientation in the spaces subsequently overgrows the second crystal orientation on the sidewalls and in the process turns over and terminates treading dislocations formed in the first crystal orientation.


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