The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2016

Filed:

Mar. 24, 2015
Applicant:

Carl Zeiss Smt Gmbh, Oberkochen, DE;

Inventor:

Thomas Fischer, Aalen, DE;

Assignee:

Carl Zeiss SMT GmbH, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/54 (2006.01); G03F 7/20 (2006.01); G02B 5/08 (2006.01); G02B 5/09 (2006.01); G02B 19/00 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70058 (2013.01); G02B 5/0891 (2013.01); G02B 5/09 (2013.01); G02B 19/0023 (2013.01); G02B 19/0095 (2013.01); G02B 26/0816 (2013.01); G03F 7/70075 (2013.01); G03F 7/70116 (2013.01);
Abstract

An illumination optical unit for EUV projection lithography has a first and second facet mirrors, each with a plurality of reflecting facets on a support. The facets of the first facet mirror can be switched between various tilt positions. In each tilt position, the tiltable first facet is assigned to a second facet of the second facet mirror for deflecting EUV radiation in the direction of this second facet. Each of the first facets is assigned to a set of second facets by its tilt positions. The two facet mirrors are arranged so that an arrangement distribution of second facets, impinged upon via the first facets, results in an illumination-angle distribution of an illumination of an illumination field.


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