The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2016

Filed:

Apr. 07, 2014
Applicant:

Advanced Mask Technology Center Gmbh & Co. KG, Dresden, DE;

Inventors:

Clemens Utzny, Dresden, DE;

Markus Bender, Dresden, DE;

Christian Buergel, Langebrueck, DE;

Albrecht Ullrich, Dresden, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/36 (2012.01); G03F 1/44 (2012.01); G01B 11/02 (2006.01); G01F 1/44 (2006.01);
U.S. Cl.
CPC ...
G03F 1/36 (2013.01); G01B 11/02 (2013.01); G01F 1/44 (2013.01);
Abstract

A method of manufacturing a photomask includes forming a mask pattern with a critical mask feature on a photomask. Shape information which is descriptive for an outline of the critical mask feature is obtained from the photomask. The shape information contains position information identifying the positions of landmarks on the outline relative to each other. The landmarks may indicate local curvature extrema, points of inflexion, sharp bends in the curvature and/or local curvature-change maxima in the outline of the mask feature, respectively. The shape information may enable a shape metrology which is not completely based on rectangular approximations of mask features.


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